The small angle diffractometer accessories are important accessories used in X-ray diffraction instruments, mainly for measuring the nanoscale parameters of materials. The corresponding accessories can be configured for small angle diffraction, and the angle range from 0°to 5°can be used for thickness testing of nano multilayer films. By measuring the nanoscale parameters of materials, powerful tools have been provided for research in fields such as materials science, biology, and chemistry.

The TDM-20 X-ray diffractometer is mainly used for phase analysis of powders, solids, and similar paste like materials. The X-ray diffractometer can be used for qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. X-ray diffractometer is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. Benchtop XRD is an experimental equipment used for analyzing the crystal structure of materials. Benchtop XRD determines the crystal structure, lattice parameters, and phase composition of the material by emitting X-rays and measuring the diffraction angle and intensity after their interaction with the sample.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries! It is a powerful analytical tool widely used in fields such as materials science, chemistry, physics, and geology.

The TD-3700 X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDDdetectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. The TD-3700 X-ray powder diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The TD-3700 X-ray powder diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with high-performance detectors. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period.

X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic,organic,and metal complexes,and to analyze the structure of special materials such as twinning, non commensurate crystals,quasicrystals,etc.Determine the accurate three-dimensional space (including bond length, bond angle,configuration,conformation,and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice;Single crystal X-ray diffractometer can provide information on the crystal cell parameters,space group,molecular structure,intermolecular hydrogen bonding and weak interactions,as well as structural information such as molecular configuration and conformation.Single crystal XRD is widely used in analytical research in chemical crystallography,molecular biology,pharmacology,mineralogy,and materials science. Single crystal XRD has high precision: 2θ angle repeatability accuracy: 0.0001°; Minimum step angle: 0.0001°; Temperature control range:100K-300K Control accuracy: ±0.3K Single crystal angle measuring instrument selects four concentric scanning circles. Single crystal XRD adopts low-temperature configuration. The company's technical personnel have completed the installation and debugging of the foreign single crystal X-ray diffractometer,and the test results have greatly satisfied foreign users. At the same time,the functionality,stability,and after-sales service of the instrument have received unanimous praise from foreign users. Overall, X-ray single crystal diffractometer plays an irreplaceable role as an important scientific instrument in research and application in multiple disciplines. With the continuous advancement and innovation of technology, we believe that in the future,single crystal XRD will demonstrate their unique value and potential in more fields.

The Graphite curved crystal monochromator is an important instrument accessory for X-ray diffraction analysis, mainly used to monochromatize the X-rays passing through the receiving slit, thereby improving the accuracy and signal-to-noise ratio of analysis. This monochromator utilizes the specific structure of graphite crystals to selectively reflect incident X-rays, allowing only X-rays of specific wavelengths (usually Kαcharacteristic X-rays) to pass through while filtering out other unwanted X-ray components such as continuous X-rays, Kβcharacteristic X-rays, and fluorescent X-rays. This selective reflection is based on Bragg's law, which states that when the angle between the incident light and the crystal plane satisfies certain conditions, coherent scattering occurs, forming diffraction peaks.When using this monochromator, attention should be paid to the preparation and placement of the sample to ensure the accuracy and symmetry of the diffraction peaks. ​Graphite curved crystal monochromator are widely used in materials research fields such as chemistry, chemical engineering, machinery, geology, minerals, metallurgy, building materials, ceramics, petrochemicals, and pharmaceuticals. In these fields, it is used for X-ray diffraction analysis to study the physical properties of materials such as crystal structure, phase transition, stress state, etc.X-ray diffractometer accessories significantly improves the accuracy and reliability of analysis by increasing the peak to background ratio and reducing background noise.

The multifunctional integratedmeasuring accessories are used for analyzing films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Multifunctional integrated measuring accessories are typically designed to enhance the functionality of X-ray diffractometer , enabling them to adapt to more diverse testing needs. There is a close relationship between multifunctional integrated measurement accessories and X-ray diffractometer. These accessories not only enhance the functionality and performance of X-ray diffractometer, but also improve its ease of operation and safety. In practical applications, users can choose suitable accessories according to their specific needs to expand the application scenarios of X-ray diffractometer and improve measurement efficiency.

Originally Battery Accessory, testing range: 0.5-160 degrees, temperature resistance: 400 ℃, beryllium window (polyester film) size: diameter 15mm (customizable); Thickness 0.1mm (customizable). They are widely used as X-ray diffractometer accessories in electrochemical systems containing carbon, oxygen, nitrogen sulfur, metal embedded complexes, etc. Originally Battery Accessory is used to fix the entire Originally Battery ​ sample stage on the angle measuring instrument of the X-ray diffractometer, serving as a connection and support.

The small angle diffractometer accessories are special device used in X-ray diffraction (XRD) experiments, mainly for measuring diffraction peaks in the low angle range to study the microstructure and properties of materials. The small angle diffractometer accessories are specialized device for X-ray diffractometers that allows for precise diffraction measurements within a lower 2θangle range (typically from 0°to 5°or lower). This technology is of great significance for studying nanostructures, mesoporous materials, multilayer films, and other materials. By configuring corresponding small angle diffractometer accessories, the thickness of nano multilayer films can be accurately measured. Overall, small angle diffractometer accessories are an indispensable and important component of X-ray diffractometers, with broad application prospects in materials science, chemistry, physics, and other fields.

The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; Single crystal X-ray diffractometer can provide information on crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. Single crystal XRD is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. The single crystal diffractometer adopts the four circle concentricity technique to ensure that the center of the angle measuring instrument remains unchanged regardless of the rotation, achieving the goal of obtaining the most accurate data and obtaining higher integrity. Four circle concentricity is a necessary condition for conventional single crystal scanning. The company's technical personnel have completed the installation and debugging of the foreign single crystal X-ray diffractometer, and the test results have greatly satisfied foreign users. At the same time, the functionality, stability, and after-sales service of the instrument have received unanimous praise from foreign users.

The TDM-20 desktop X-ray diffractometer is mainly used for phase analysis of powders, solids, and similar paste like materials.Benchtop XRD utilizes the principle of X-ray diffractometer to perform qualitative or quantitative analysis, crystal structure analysis, and other polycrystalline materials such as powder samples and metal samples. The TDM-20 desktop X-ray diffractometer is widely used in industries such as industry, agriculture, national defense, pharmaceuticals, minerals, food safety, petroleum, education, and scientific research. The loading of a new high-performance array detector has led to a significant improvement in the performance of benchtop XRD。 Benchtop XRD equipment has a small volume and light weight; The working power of the Benchtop XRD high-voltage power supply can reach 1600 watts; Benchtop XRD can quickly calibrate and test samples; Benchtop XRD circuit control is simple and easy to debug and install; The repeatability of the Benchtop XRD angle can reach 0.0001.

The TD-3700 high-resolution X-ray diffractometer, with all the advantages of the TD-3500 X-ray diffractometer, is equipped with a high-performance array detector. Compared to scintillation detectors or proportional detectors, diffraction calculation intensity can be increased by several tens of times, and complete high-sensitivity, high-resolution diffraction patterns and higher counting intensity can be obtained in a shorter sampling period. The TD-3700 high-resolution X-ray diffractometer supports both conventional diffraction data scanning and transmission data scanning methods. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.