X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.

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X-ray diffraction spectroscopy mainly analyzes the crystal state and microstructure of materials, and there are two X-ray diffraction measurement methods for crystal analysis.

Automatic X-ray orientation instrument is an indispensable instrument for precision processing and manufacturing crystal devices. It is widely used in the research, processing and manufacturing of crystal materials.

The composition of the diffraction pattern is mainly the position and intensity of the diffraction peak, and our analysis of the XRD pattern is based on the changes in the intensity and position to explain the changes in the micro and macro of the material.

An X-ray diffractometer is a precision instrument used to study the crystal structure, morphology and properties of matter. During the packaging and transportation process, certain measures need to be taken to ensure that the safety and performance of the instrument are not affected.

As one of the important means of material structure characterization, XRD is widely used in materials, physics, chemistry, medicine and other fields.

X-ray diffractometer is mainly used for phase characterization, quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis of powder, block or thin film samples, etc.

In X-ray analysis, an instrument used to measure the Angle between an incident X-ray beam and a diffracted X-ray beam. The diffractometer automatically maps the variation of the diffraction intensity with the 2θ Angle.

Polycrystalline X-ray diffractometer, also known as powder diffractometer, is usually used to measure powder, polycrystalline metal or polymer bulk materials.