The TD-3500 X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples. The TD-3500 X-ray diffractometer produced by Dandong Tongda Technology Co., Ltd. adopts imported Siemens PLC control, which makes the TD-3500 X-ray diffractometer have the characteristics of high accuracy, high precision, good stability, long service life, easy upgrade, easy operation and intelligence, and can flexibly adapt to testing analysis and research in various industries!   The TD-3500 X-ray diffractometer adopts an X-ray generator (high-frequency and high-voltage solid-state generator, power frequency generator optional), which has a high degree of automation, extremely low failure rate, strong anti-interference ability, good system stability, and can extend the service life of the whole machine. PLC and computer interface automatically control the opening and closing of the light gate, automatically control the rise and fall of tube pressure and tube flow, and have the function of automatically training X-ray tubes. Real time online monitoring using a touch screen to display instrument status. The TD-3500 X-ray diffractometer adopts advanced recording control unit, PLC control circuit, advanced PLC control technology and true color touch screen to achieve human-computer interaction. The system hardware adopts modular design concept, greatly increasing the anti-interference ability of the system and making it more stable. Due to the use of imported Siemens PLC control circuits with high precision and automation, the system can operate stably for a long time without any faults. The TD-3500 X-ray diffractometer system has the following advantages over the microcontroller circuits used by other companies: Simple circuit control, easy to debug and install; Due to its modular design, the system maintenance is very simple, and users can repair and debug it themselves without the need for manufacturer technicians to be present; Adopting advanced true color touch screen to achieve human-computer interaction, with complete protection functions and very convenient operation, the highly three-dimensional animation design is more humanized, intuitive, and convenient for operators to use and judge fault information, etc; Greatly improving the counting stability of the system, thereby enhancing the overall stability of the entire machine; Due to the strong expansion capability of PLC, it can easily expand various functional accessories without the need to add any additional hardware circuits. Detector of TD-3500 X-ray diffractometer Proportional detector (PC) or scintillation detector (SC). High precision angle measuring instrument for TD-3500 X-ray diffractometer The TD series angle measuring instrument adopts imported high-precision bearing transmission, and the motion control is completed by a high-precision fully closed-loop vector drive servo system. The intelligent drive includes a 32-bit RISC microprocessor and a high-resolution magnetic encoder, which can automatically correct extremely small motion position errors, ensuring high precision and accuracy of measurement results. The angle reproducibility can reach 0.0001 degrees, and smaller step angles can reach 0.0001 degrees. Application areas of TD-3500 X-ray diffractometer: Materials Science: Used to study key information such as crystal structure, phase transition behavior, and texture of materials. Chemical analysis: can be used for qualitative or quantitative analysis of organic, inorganic, polymer compounds and other substances. Geology: helps people understand the formation of mineral deposits, the evolution of the Earth, and more. Biopharmaceuticals: Determine the crystal structure of drugs, optimize drug formulations, and improve drug efficacy. X-ray diffractometer is a powerful analytical tool widely used in multiple fields. By accurately measuring diffraction angle and intensity, it can provide detailed information about the crystal structure and composition of materials.

The TD-3700 high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply. The TD-3700 high-resolution X-ray diffractometer supports not only the conventional diffraction data scanning method, but also the transmission data scanning method. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation. The array detector fully utilizes mixed photon counting technology, with no noise, fast data acquisition, and more than ten times the speed of scintillation detectors. It has excellent energy resolution and can effectively remove fluorescence effects. Multi channel detectors have faster readout times and achieve better signal-to-noise ratios. A detector control system with electronic gating and external triggering effectively completes system synchronization. The working principle of TD-3700 high-resolution X-ray diffractometer: By utilizing the fluctuation of X-rays, when they are irradiated onto a crystal, atoms or ions in the crystal act as scattering centers, scattering X-rays in all directions. Due to the regularity of atomic arrangement in crystals, these scattered waves interfere with each other and reinforce each other in certain directions, forming diffraction. By measuring the diffraction angle and diffraction intensity, the structural information of the crystal can be obtained. The main features of TD-3700 high-resolution X-ray diffractometer are: (1) Easy to operate, one click collection system; (2) Modular design, plug and play instrument accessories, no need for calibration; (3) Real time online monitoring using touch screen to display instrument status; (4) Electronic lead door interlocking device, dual protection, ensuring user safety; (5) High frequency and high-voltage X-ray generator, with stable and reliable performance; (6) Advanced recording control unit with strong anti-interference ability. The high precision of the TD-3700 high-resolution X-ray diffractometer enables high-precision analysis of the crystal structure of materials, such as precise determination of lattice constants, cell parameters, etc. The angle measurement accuracy can reach ±0.0001°. The high resolution of TD-3700 high-resolution X-ray diffractometer can clearly distinguish adjacent diffraction peaks, accurately analyze diffraction information of different crystal planes for complex crystal structures, and reveal the microstructure characteristics of materials. The non-destructive nature of the TD-3700 high-resolution X-ray diffractometer: it will not cause damage to the sample during the testing process, and the sample can be kept in its original state for multiple tests, which is particularly important for precious or difficult to obtain samples. Rapid analysis of TD-3700 high-resolution X-ray diffractometer: Modern high-resolution X-ray diffractometers have fast detection capabilities and can complete sample testing in a short period of time, improving work efficiency. 3. Application areas of TD-3700 high-resolution X-ray diffractometer: Semiconductor materials: used to detect the crystal quality of semiconductor single crystal materials and epitaxial thin films, analyze lattice mismatch, defects and other information, which helps optimize the performance of semiconductor devices. Superconducting materials: Study the crystal structure and phase transition process of superconducting materials to provide a basis for optimizing superconducting properties. Nanomaterials: Analyzing the grain size, crystal structure, microscopic strain, etc. of nanomaterials helps researchers better understand their properties and applications. Other fields: It is also widely used in research and quality control of metal materials, ceramic materials, polymer materials, biomaterials, and other fields. High resolution X-ray diffractometer is a high-precision, high-resolution, non-destructive, and fast analytical instrument with important application value in many fields.

1. Function of single crystal diffractometer: The TD-5000 X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; X-ray single crystal diffractometer can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation.X-ray single crystal diffractometer is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science. The X-ray single crystal diffractometer is a high-tech product funded by the Ministry of Science and Technology of China's National Major Scientific Instrument and Equipment Development Project, led by Dandong Tongda Technology Co., Ltd., filling the gap in the development and production of single crystal diffractometers in China. 2. Characteristics of single crystal diffractometer: The whole machine adopts programmable logic controller (PLC) control technology; Easy to operate, one click collection system; Modular design, plug and play accessories, no need for calibration; Real time online monitoring through touch screen, displaying instrument status; High power X-ray generator with stable and reliable performance; Electronic lead door interlocking device, dual protection. 3. Accuracy of single crystal diffractometer: 2 θ angle repeatability accuracy: 0.0001 °; Minimum step angle: 0.0001 ° Temperature control range: 100K-300K; Control accuracy: ± 0.3K 4. Angle measuring instrument used in single crystal diffractometer: The use of four concentric circles technique ensures that the center of the angle measuring instrument remains unchanged regardless of any rotation, achieving the goal of obtaining the most accurate data and obtaining higher completeness. Four concentric circles are a necessary condition for conventional single crystal diffractometer scanning. 5. High speed two-dimensional detector used in X-ray single crystal diffractometer: The detector combines the key technologies of single photon counting and mixed pixel technology to achieve the best data quality while ensuring low power consumption and low cooling. It is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. The mixed pixel technology can directly detect X-rays, make the signal easier to distinguish, and efficiently provide high-quality data. 6. Low temperature equipment used in X-ray single crystal diffractometer: The data collected through low-temperature equipment yields more ideal results. With the help of low-temperature equipment, more advantageous conditions can be provided to enable undesirable crystals to obtain ideal results, as well as ideal crystals to obtain more ideal results. Temperature control range: 100K~300K; Control accuracy: ± 0.3K; Liquid nitrogen consumption: 1.1~2 liters/hour; 7. Optional accessory, multi-layer film focusing lens: X-ray tube power: 30W or 50W, etc; Divergence: 0.5~1 mrad; X-ray tube target material: Mo/Cu target; Focal spot: 0.5~2mm.

X-ray absorption fine structure Spectrum (XAFS) is a powerful tool for studying the local atomic or electronic structure of materials, widely used in popular fields such as catalysis, energy, and nanotechnology. The principle of X-ray absorption fine structure Spectrum(XAFS): X-ray absorption fine structure Spectrum refers to high-resolution spectra near the characteristic edges of atomic core electrons absorbing X-rays. When the energy of X-rays is the same as the excitation energy of the inner shell electrons of the measured element, they will be strongly absorbed, resulting in an absorption limit (or absorption edge). Near the absorption edge, due to multiple scattering and other reasons, the absorption coefficient of X-rays will exhibit oscillatory phenomena, namely fine structure. 2. Core advantages of X-ray absorption fine structure Spectrum(XAFS): (1) The highest luminous flux product, with a photon flux exceeding 1000000 photons/second/eV, and a spectral efficiency several times higher than other products; Obtain data quality equivalent to synchrotron radiation (2) Excellent stability, monochromatic light intensity stability of the light source is better than 0.1%, and repeated energy drift is less than 50 meV (3) 1% detection limit, high light flux, excellent optical path optimization, and excellent light source stability ensure that high-quality EXAFS data can still be obtained when the measured element content is>1%. 3. Application areas of XAFS: Industrial catalysis, energy storage materials, nanomaterials, environmental toxicology, qualitative analysis, heavy element analysis, etc. 4. Main features of XAFS: (1) Short range ordering: EXAFS depends on short-range interactions and does not rely on long-range ordering. XAFS can be used to study the structure of disordered systems such as amorphous, liquid, molten, and catalyst active centers. (2) Element specificity: Fluorescence method can be used to measure samples of elements with concentrations as low as one millionth. By adjusting the incident X-ray energy, the neighboring structures of atoms of different elements in the same compound can be studied. (3) Polarization characteristics: Polarized X-rays can be used to measure atomic bond angles and surface structures in oriented samples. The X-ray absorption fine structure Spectrum, with its unique principles, significant characteristics, and wide application fields, has become an indispensable and important tool in multiple fields such as materials science, catalytic chemistry, and energy research, providing strong support for in-depth exploration of material microstructures and electronic states.

The automatic sample changer used in X-ray diffractometers is a device used for automated sample replacement, aimed at improving the efficiency and accuracy of X-ray diffraction experiments. Driven by an imported stepper motor and controlled by an imported Siemens programmable logic controller (PLC), there is no need for manual sample replacement. The system automatically measures samples continuously and saves data automatically. Multiple samples can be loaded at once for continuous measurement. The main components of an automatic sample changer are: Sample transfer mechanism: usually includes a conveyor belt, elastic pressing plate, and driving motor, responsible for sequentially transferring the test sample plates to the retrieval position. Sample replacement mechanism: generally composed of clamping components, action driving components, and turntable, it can automatically replace the sample plate between the conveyor belt pick-up position and the diffraction instrument sample stage. Sensor module: such as photoelectric sensor module and photoresistor sensor module, used to detect the position of the sample and the working status of the diffractometer, in order to control the circuit module to make corresponding control actions. Control circuit module: Connect and control the collaborative work of the above-mentioned mechanisms and modules to ensure accurate and stable operation of the automatic sample changing process. Power module: provides power support for the entire automatic sample changing device. 2. Working principle of automatic sample changer: After the diffractometer completes the testing of the current sample, the sensor module detects the state change of the diffractometer shutter light and transmits the signal to the control circuit module. After receiving the signal, the control circuit module activates the sample replacement mechanism to move it to the conveyor belt pick-up position and the diffraction instrument sample stage, and clamps the sample plates at the two positions respectively through the clamping parts. Then, the sample replacement mechanism swaps the positions of the two sample plates to complete the sample replacement operation. Next, the conveyor belt starts and transports the next sample board to the pick-up position, waiting for the next sample change. 3. Advantages and characteristics of automatic sample changers: • Improve testing efficiency: It can automatically replace samples during the diffraction instrument testing process without manual intervention, greatly shortening the testing cycle and improving work efficiency. • Reduce human error: avoid operational errors and mistakes that may occur when manually replacing samples, and improve the accuracy and reliability of test results. • Instrument protection: reduces the possibility of instrument failure caused by frequent manual opening and closing of the diffractometer door, and extends the service life of the diffractometer. • Suitable for testing a large number of samples: It can load multiple samples to meet the needs of continuous testing of a large number of samples, and is suitable for high-throughput detection in fields such as scientific research and production. In summary, the automatic sample changer used in X-ray diffraction instruments is an efficient and accurate automated equipment that brings many conveniences and advantages to X-ray diffraction experiments, helping to improve experimental efficiency and quality.

The graphite curved crystal monochromator used in X-ray diffractometers is a key component for selecting specific wavelengths of X-rays and removing unwanted radiation such as K β lines and fluorescent X-rays. The graphite curved crystal monochromator is a component installed in front of the X-ray detector, which monochromatizes the X-rays passing through the receiving slit and only detects the Kα characteristic X-rays in the X-ray spectrum. By using this device, continuous X-rays, K β characteristic X-rays, and fluorescent X-rays can be completely eliminated, enabling high signal-to-noise ratio X-ray diffraction analysis. When copper target X-ray tubes are used in conjunction with corresponding monochromators, fluorescent X-rays generated from Mn, Fe, Co, Ni based samples can be eliminated, making them suitable for analysis of various samples. working principle: Bragg diffraction: Based on Bragg's law, when X-rays are incident on a crystal at a certain angle, if 2dsin θ=n λ (where d is the interplanar spacing of the crystal, θis the incident angle, λ is the wavelength of the X-ray, and n is an integer), diffraction will occur. It utilizes this principle to adjust the orientation of the crystal so that only X-rays that meet specific conditions can pass through, thereby achieving the selection of X-ray wavelengths. Energy resolution: Due to the interplanar spacing and structural characteristics of graphite crystals, it can effectively distinguish X-rays of different energies. High energy resolution graphite curved crystal monochromator can further reduce unwanted radiation and improve the quality of diffraction data. Structural features: Curved shape: graphite curved crystal monochromator typically have a curved shape, which helps focus X-rays and improve diffraction efficiency. At the same time, the curved shape also helps to reduce the stress on the crystal, improve its stability and service life. High purity graphite: Graphite curved crystal monochromator is usually made of high-purity graphite materials to ensure their good diffraction performance and stability. High diffraction efficiency: It has a high diffraction efficiency, which can effectively select X-rays of the desired wavelength, thereby improving the quality of diffraction data. Wide wavelength range: It can operate over a wide wavelength range and is suitable for various types of X-ray diffraction experiments. Good stability: Due to the use of high-purity graphite material, it has good stability and a long service life. Application areas: Materials Science: In the field of materials science, X-ray diffractometers are widely used to study the crystal structure, phase composition, and other properties of materials. The graphite curved crystal monochromator, as an important component of X-ray diffractometer, provides important technical support for materials science research. Physics: In the field of physics, X-ray diffractometers are also used to study the microstructure and physical properties of matter. In summary, the graphite curved crystal monochromator used in X-ray diffractometers is an efficient and accurate X-ray selection and filtering device, providing important technical support for X-ray diffraction experiments.

The rotating sample holder in an X-ray diffractometer is a key component used for precise adjustment and fixation of the sample position,the sample can rotate within its own plane, which is beneficial for errors caused by coarse grains. For samples with texture and crystallography, rotating sample holder ensures good reproducibility of diffraction intensity and eliminates preferred orientation. Working principle of rotating sample holder: When the X-ray diffractometer is working, high-energy X-rays generated by the X-ray source are irradiated onto the sample fixed on the rotating sample stage. Due to the specific crystal structure and lattice parameters of the sample, X-rays will undergo scattering, absorption, and diffraction phenomena when interacting with the sample, where diffraction phenomena occur according to the requirements of the Bragg equation. The rotating sample holder can rotate at smaller angles according to the setting, allowing the sample to receive X-ray irradiation at different angles, thereby obtaining diffraction patterns at different angles. In this way, the detector can measure the X-ray intensity after sample diffraction and convert it into an electrical signal to be transmitted to the computer for data processing. The main function of the rotating sample holder is: Rotation method: β axis (sample plane) Rotation speed: 1~60RPM Small step width: 0.1 º Operation mode: Constant speed rotation for sample scanning (step, continuous) Advantages of rotating sample holder: The rotating sample holder can improve the accuracy of diffraction data: For samples with irregular powder or particle shapes, the characteristic of preferred orientation is prone to occur during conventional powder sample preparation, resulting in deviations in the distribution of diffraction intensity and affecting the accuracy of diffraction result analysis. Rotating the sample stage can move the sample in a certain form in an appropriate space, eliminating the influence of preferred orientation to a certain extent, thereby improving the accuracy of diffraction data. The rotating sample holder can adapt to various testing needs: able to adapt to different types of X-ray diffraction angle measuring instruments, such as vertical angle measuring instruments, low-power compact powder diffraction equipment, etc., providing convenience for different testing needs. And rotating sample holder can meet the requirements of various samples and testing conditions by adjusting parameters such as speed and steering. The rotating sample holder can expand the instrument's analytical capabilities: New types of rotating sample stages are constantly being developed and applied, such as some sample stages for in-situ electrochemical X-ray diffraction analysis, which can monitor and analyze the changes of materials in different environments or conditions in real time, expanding the analysis capabilities of X-ray diffraction equipment. In summary, the rotating sample holder in X-ray diffractometer is crucial for accurately obtaining crystal structure information of substances. the rotating sample holder can not only improve the accuracy of diffraction data, but also adapt to various testing needs and expand the analytical capabilities of the instrument.

In X-ray diffractometer, the multifunctional integrated measuring accessories are crucial component that greatly enhances the functionality and flexibility of the instrument. Used for the analysis of films on boards, blocks, and substrates, and can perform tests such as crystal phase detection, orientation, texture, stress, and in-plane structure of thin films. Basic overview of multifunctional integrated measuring accessories: Definition: They are general term for a series of additional devices or modules used in X-ray diffractometer to expand instrument functions, improve measurement accuracy and efficiency. Purpose: These attachments aim to enable X-ray diffractometer to meet a wider range of experimental needs and provide more comprehensive and accurate material structure information. The functional characteristics of multifunctional integrated measuring accessories: Perform polar diagram testing using transmission or reflection methods; Stress testing can be conducted using either the parallel tilt method or the same tilt method; Thin film testing (in-plane rotation of the sample). Technical characteristics of multifunctional integrated measuring accessories: High precision:They typically use advanced sensing technology and control systems to ensure high precision and repeatability of measurements. Automation: Many attachments support automated operations and can be seamlessly integrated with the X-ray diffractometer host to achieve one click measurement. Modular design: facilitates users to select and combine different accessory modules according to their actual needs. Application areas of multifunctional integrated measuring accessories: Widely used in fields such as materials science, physics, chemistry, biology, and geology; Evaluation of metal assembly structures such as rolled plates; Evaluation of ceramic orientation; Evaluation of crystal priority orientation in thin film samples; Residual stress testing of various metal and ceramic materials (evaluation of wear resistance, cutting resistance, etc.); Residual stress testing of multilayer films (evaluation of film peeling, etc.); Analysis of surface oxidation and nitride films on high-temperature superconducting materials such as thin films and metal plates; Glass Si、Analysis of multilayer films on metal substrates (magnetic thin films, metal surface hardening films, etc.); Analysis of electroplating materials such as macromolecular materials, paper, and lenses. The multifunctional integrated measuring accessories in X-ray diffractometer are the key to improving instrument performance. They not only enhance the functionality of the instrument, but also improve the accuracy and efficiency of measurement, providing researchers with more comprehensive and in-depth material analysis methods. With the continuous advancement of technology, these attachments will continue to play an important role in promoting scientific research in related fields to achieve more breakthroughs.

The high temperature accessory​ in a diffractometer is an additional device that can perform X-ray diffraction analysis on samples under high temperature conditions. To understand the changes in crystal structure of samples during high-temperature heating and the changes in mutual dissolution of various substances during high-temperature heating. Working principle of high temperature accessory: By using methods such as resistance heating, induction heating, or radiation heating, the sample is heated within a set temperature range. At the same time, it is equipped with high-precision temperature sensors and control systems to monitor and adjust the temperature of the sample in real time, ensuring the stability and accuracy of the temperature. The temperature control accuracy can reach ±0.5℃ or even higher. In order to maintain the stability of the sample at high temperatures and prevent it from reacting with oxygen in the air, high temperature accessory usually require an atmosphere protection system. Common atmospheres include inert gases such as argon, nitrogen, etc. The atmosphere control system can accurately control the flow rate and pressure of the atmosphere, providing a stable experimental environment for the sample. The main functions of high temperature accessory is: Real time monitoring of sample phase transition, chemical reactions, crystal structure changes, and other processes can be carried out in high-temperature environments to obtain information on the structure and properties of substances at different temperatures. By analyzing the position, intensity, and shape of diffraction peaks, the crystal cell parameters, crystal structure, phase composition, and other information of the sample can be obtained, and the content of each component can be accurately measured. Study the rate, mechanism, and diffusion behavior of chemical reactions. For example, observing the structural changes of catalysts during high-temperature reactions, understanding the formation and disappearance of their active centers, and optimizing the performance of catalysts. Application area of high temperature accessory: Used to study the phase transition, crystal structure evolution, and performance changes of high-temperature superconducting materials, metal alloys, ceramic materials, etc. at different temperatures, providing a basis for material design and preparation. Monitoring the changes in substances during chemical reactions, such as studying the structural changes of catalysts and the evolution of active centers in high-temperature catalytic reactions, can help develop efficient catalysts. Study the physical properties of substances at high temperatures, such as magnetism, electronic structure, and their relationship with temperature, and explore new physical phenomena and laws. Technical parameter of high temperature accessory: Temperature setting: Inert gas environment from room temperature to 1200 ℃ Vacuum environment: high temperature of 1600 ℃ Temperature control accuracy: ± 0.5 ℃ Window material: Polyester film Cooling method: deionized water circulation cooling In summary, the high temperature accessory in the diffractometer is an important testing tool that can perform X-ray diffraction analysis on samples under high temperature conditions, providing strong support for research in fields such as materials science, chemical engineering, and physics.

The multi-function sample holder in an X-ray diffractometer is a device used for placing and fixing samples, with multiple functions and features. It can test trace amounts of powder samples, as well as samples that are sheet-like, large-sized, irregular, cannot be cut, or ground into powder. The multi-function sample holder sample fixation and support: The sample holder can firmly fix the sample, ensuring that the sample remains stable during X-ray diffraction and preventing the accuracy and reliability of diffraction data from being affected by sample movement. The multi-function sample holder height and angle adjustment: It has the function of adjusting height and angle, and can flexibly adjust the distance and relative angle between the sample and the X-ray tube and detector according to the size, shape, and detection requirements of different samples, in order to obtain the best diffraction effect. The multi-function sample holder rotation function: Some sample tables can rotate, allowing the sample to receive X-ray irradiation at different angles, thereby obtaining more diffraction information from different angles, which helps to comprehensively analyze the crystal structure and orientation of the sample. The multi-function sample holder adaptation: It can adapt to different types of samples, such as solid, liquid, powder, etc. By replacing different sample fixtures or accessories, it can meet the testing requirements of various samples. The multi-function sample holder environmental control: Some advanced sample holders are also equipped with environmental control systems that can test samples under specific temperature, humidity, atmosphere, and other conditions to simulate the effects of different environments on samples, further expanding the application range of X-ray diffractometers. The multi-function sample holder in X-ray diffractometer is a powerful, flexible and versatile auxiliary equipment, which is of great significance for improving the accuracy and efficiency of X-ray diffraction experiments.

Parallel optical film measuring accessory is an optical component used to enhance the signal intensity of thin films and reduce the influence of substrate signals on measurement results. Usually used in optical experiments or instruments, mainly for generating parallel beams or conducting optical measurements on thin film samples. By increasing the length of the grating, more precise control and filtering of light can be achieved. When light passes through, the grating plate can filter out more scattered lines, making the transmitted light purer and more concentrated, thereby reducing the interference of scattered light on the thin film signal and enhancing the signal strength of the thin film itself, improving the accuracy and reliability of measurement. 1. Main function of parallel optical film measuring accessory Improving measurement accuracy: In thin film related detection and analysis, such as thin film thickness measurement, optical constant determination, etc., parallel light thin film attachments can effectively reduce the influence of substrate signals, making the measurement results closer to the true characteristics of the thin film, thereby improving measurement accuracy and precision. Enhance signal strength: It helps to increase the intensity of the light signal reflected or transmitted by the thin film, which is particularly important for some thin film samples with weaker signals. The enhanced signal can be more clearly received and recognized by the detector, reducing the detection limit and improving the sensitivity of the instrument for detecting thin film samples. Improving image quality: In some applications that require imaging observation of thin films, such as observing the surface morphology of thin films under a microscope, parallel light thin film attachments can reduce background noise and blurring caused by scattered light, making the image of the thin film clearer, higher contrast, and easier to observe and analyze the detailed structure of the thin film. 2. Main components of parallel optical film measuring accessory Light source: Typically, lasers, LEDs, or other monochromatic light sources are used. Collimator lens: converts divergent light beams into parallel light. Sample stand: used for placing film samples, usually adjustable in position and angle. Detector: used to receive transmitted or reflected light signals for measurement and analysis. 3. Application fields of parallel optical film measuring accessory Optical research: used to study the optical properties of thin films, such as interference, diffraction, etc. Materials Science: Used to measure the thickness and refractive index of thin films and evaluate material properties. Industrial testing: used for quality control and testing in film production. 4. Instructions for parallel optical film measuring accessory Adjust the light source: Ensure that the light source is stable and the beam is uniform. Collimated beam: Adjust the beam of light through a collimating lens to make it parallel. Place the sample: Place the film sample on the sample stage, adjust the position and angle. Measurement and analysis: Use detectors to receive light signals, record data, and perform analysis. 5. Precautions Light source stability: Ensure the stability of the light source to avoid measurement errors. Cleaning of optical components: Keep the optical components clean to avoid dust and stains affecting the measurement results. Sample preparation: Ensure that the film sample is uniform and defect free to obtain accurate measurement results. In summary, the parallel optical film measuring accessory is an important optical component that plays a crucial role in multiple fields and is of great significance in promoting scientific research and technological progress in related fields.

The medium and low temperature accessory of an X-ray diffractometer is a key component used for X-ray diffraction analysis in low-temperature environments.The medium and low temperature accessory is widely used in research and development work in materials science, physics, chemistry, and other fields, especially suitable for scenarios that require structural analysis of materials under different temperature conditions. In order to understand the changes in crystal structure during low-temperature refrigeration process, the following are the technical parameters of the medium and low temperature accessory: Vacuum environment:- 196~500℃ Temperature control accuracy: ± 0.5 ℃ Refrigeration method: liquid nitrogen (consumption less than 4L/h) Window material: Polyester film Cooling method: deionized water circulation cooling In short, the medium and low temperature accessory of X-ray diffractometer is important equipment component that can provide strong support for scientific research and material analysis.The medium and low temperature accessory of a diffractometer is one of the important tools in the field of material structure analysis, with broad application prospects and significant research value.The medium and low temperature accessory​ of the diffractometer is a key component to ensure the normal operation and accurate measurement of the instrument under low-temperature conditions. Its design and performance directly affect the accuracy and reliability of experimental results. When selecting and applying medium and low temperature accessory, experimental requirements, sample characteristics, as well as the technical parameters and performance characteristics of the accessories should be fully considered to ensure the best experimental results.