The TD-3700 high-resolution X-ray diffractometer is a new member of the TD series, equipped with a variety of high-performance detectors such as high-speed one-dimensional array detectors, two-dimensional detectors, SDD detectors, etc. It integrates fast analysis, convenient operation, and user safety. The modular hardware architecture and customized software system achieve a perfect combination, making its failure rate extremely low, anti-interference performance good, and ensuring long-term stable operation of high-voltage power supply.

The TD-3700 high-resolution X-ray diffractometer supports not only the conventional diffraction data scanning method, but also the transmission data scanning method. The resolution of transmission mode is much higher than that of diffraction mode, which is suitable for structural analysis and other fields. Diffraction mode has strong diffraction signals and is more suitable for routine phase identification in the laboratory. In addition, in the transmission mode, the powder sample can be in trace amounts, which is suitable for data acquisition in cases where the sample size is relatively small and does not meet the requirements of diffraction method for sample preparation.

The array detector fully utilizes mixed photon counting technology, with no noise, fast data acquisition, and more than ten times the speed of scintillation detectors. It has excellent energy resolution and can effectively remove fluorescence effects. Multi channel detectors have faster readout times and achieve better signal-to-noise ratios. A detector control system with electronic gating and external triggering effectively completes system synchronization.

The working principle of TD-3700 high-resolution X-ray diffractometer:

By utilizing the fluctuation of X-rays, when they are irradiated onto a crystal, atoms or ions in the crystal act as scattering centers, scattering X-rays in all directions. Due to the regularity of atomic arrangement in crystals, these scattered waves interfere with each other and reinforce each other in certain directions, forming diffraction. By measuring the diffraction angle and diffraction intensity, the structural information of the crystal can be obtained.

The main features of TD-3700 high-resolution X-ray diffractometer are:

(1) Easy to operate, one click collection system;    

(2) Modular design, plug and play instrument accessories, no need for calibration;

(3) Real time online monitoring using touch screen to display instrument status;

(4) Electronic lead door interlocking device, dual protection, ensuring user safety;

(5) High frequency and high-voltage X-ray generator, with stable and reliable performance;

(6) Advanced recording control unit with strong anti-interference ability.

The high precision of the TD-3700 high-resolution X-ray diffractometer enables high-precision analysis of the crystal structure of materials, such as precise determination of lattice constants, cell parameters, etc. The angle measurement accuracy can reach ±0.0001°.

The high resolution of TD-3700 high-resolution X-ray diffractometer can clearly distinguish adjacent diffraction peaks, accurately analyze diffraction information of different crystal planes for complex crystal structures, and reveal the microstructure characteristics of materials.

The non-destructive nature of the TD-3700 high-resolution X-ray diffractometer: it will not cause damage to the sample during the testing process, and the sample can be kept in its original state for multiple tests, which is particularly important for precious or difficult to obtain samples.

Rapid analysis of TD-3700 high-resolution X-ray diffractometer: Modern high-resolution X-ray diffractometers have fast detection capabilities and can complete sample testing in a short period of time, improving work efficiency.

3. Application areas of TD-3700 high-resolution X-ray diffractometer:

Semiconductor materials: used to detect the crystal quality of semiconductor single crystal materials and epitaxial thin films, analyze lattice mismatch, defects and other information, which helps optimize the performance of semiconductor devices.

Superconducting materials: Study the crystal structure and phase transition process of superconducting materials to provide a basis for optimizing superconducting properties.

Nanomaterials: Analyzing the grain size, crystal structure, microscopic strain, etc. of nanomaterials helps researchers better understand their properties and applications.

Other fields: It is also widely used in research and quality control of metal materials, ceramic materials, polymer materials, biomaterials, and other fields. High resolution X-ray diffractometer is a high-precision, high-resolution, non-destructive, and fast analytical instrument with important application value in many fields.