The X-ray single crystal diffractometer is mainly used to determine the three-dimensional spatial structure and electron cloud density of crystalline substances such as inorganic, organic, and metal complexes, and to analyze the structure of special materials such as twinning, non commensurate crystals, quasicrystals, etc. Determine the accurate three-dimensional space (including bond length, bond angle, configuration, conformation, and even bonding electron density) of new compound (crystalline) molecules and the actual arrangement of molecules in the lattice; It can provide information on the crystal cell parameters, space group, crystal molecular structure, intermolecular hydrogen bonding and weak interactions, as well as structural information such as molecular configuration and conformation. It is widely used in analytical research in chemical crystallography, molecular biology, pharmacology, mineralogy, and materials science.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

X-ray diffractometer is mainly used for phase qualitative and quantitative analysis, crystal structure analysis, material structure analysis, crystal orientation analysis, macroscopic or microscopic stress determination, grain size determination, crystallinity determination, etc. of powder, block or film samples.

The use of hybrid pixel detector can achieve the best data quality while ensuring low power consumption and low cooling. This detector combines the key technologies of single photon counting and hybrid pixels, and is applied in various fields such as synchrotron radiation and conventional laboratory light sources, effectively eliminating the interference of readout noise and dark current. Hybrid pixel technology can directly detect X-rays, making it easier to distinguish signals, and detector can efficiently provide high-quality data.

The high-precision multifunctional angle measuring instrument of Tongda Technology can not only measure conventional powder samples, but also test liquid samples, colloidal samples, viscous samples, loose powders, and large solid samples.

X-ray diffractometer is mainly used for qualitative or quantitative analysis of sample phases, crystal structure analysis, crystallinity determination, etc. Various special functional accessories and corresponding control and application software can be installed according to actual needs to form a diffraction system with special functions. X-ray diffractometer is a laboratory analytical instrument with high precision.

Founded in 2002, Dandong Tongda Technology Co., Ltd. is a national high-tech enterprise with X-ray analysis instruments and X-ray non-destructive testing instruments as its leading products

Recently, the Ministry of Science and Technology announced the list of the second batch of key projects under the 2023 National key research and Development Plan "Basic scientific research Conditions and major scientific instruments and equipment research and development".

An X-ray diffractometer is a precision instrument used to study the crystal structure, morphology and properties of matter. During the packaging and transportation process, certain measures need to be taken to ensure that the safety and performance of the instrument are not affected.

In the development of X-ray imaging technology, X-ray imaging technology has formed a relatively complete X-ray non-destructive testing technology system. In order to meet the needs, new detection technology is constantly innovated, and X-ray online detection technology is adopted.

Dandong Tongda TD-5000X-ray single crystal diffractometer won the "ACCSI2023 Instrument and Detection 3i Award --2022 Annual Scientific Instrument Industry Outstanding New Product Award".

The principle of many characterization devices is to make electrons interact with substances that need to be detected, excite secondary electrons, or make atomic level transitions and backtrips, and release characteristic energy.