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XRD, is short for X-ray diffraction, as a material person, no matter what material is done, XRD is the most commonly used, the most basic means of characterization.
X-ray Absorption Fine Structure(XAFS) is a powerful tool for studying the local atomic or electronic struct ure of materials based on synchrotron radiation light source.
When a beam of extremely thin X-rays passes through a material with an uneven electron density of nanometer size, the X-rays will spread out in a small angular region near the direction of the original beam, this phenomenon is called small-angle X-ray scattering.
Small-angle X-ray scattering is the diffuse scattering of electrons to X-rays in the small Angle range near the original beam. Small-angle scattering occurs in all materials with non-uniform electron density on the nanometer scale.
Small Angle X-ray diffraction (SAXD) is mainly used to determine the spacing of very large crystal faces or the structure of thin films.
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The use of X-rays to study the structure of crystals mainly through the X-ray diffraction phenomenon in the crystal.
X-ray diffraction technique is an analytical method used to study the structure of a substance. It determines the structure of a crystal by measuring the Angle of X-ray diffraction in the crystal.