The TDF series X-ray crystal analyzer is a large-scale X-ray instrument used to study the internal microstructure of substances. It utilizes the principle of interaction between X-ray and crystal to determine the atomic arrangement inside the crystal by analyzing the diffraction pattern of X-ray. Mainly used for single crystal orientation, defect inspection, determination of lattice parameters, determination of residual stress, study of the structure of plate and rod, investigation of the structure of unknown substances and single crystal dislocations.

The  X-ray crystal analyzer, as an X-ray instrument, provides valuable information for materials science research and other related fields. With the continuous advancement of technology and the expansion of applications, X-ray crystal analyzer will continue to play an important role in scientific research and industrial production.